October 24, 2024 |
With gold prices well above $2,000 an ounce, X-ray fluorescence (XRF) measurement is critical to controlling costs by assuring that precious metals are plated to the exact thickness and alloy composition intended.
XRF measurement of the layers is also important to assure the right color and appearance of the finished goods. Join Fischer as it discusses how XRF measurements can be used for process control, quality control and incoming inspection of electroplated jewelry pieces.
Devarsh Shah
Technical Manager
Devarsh Shah is a technical manager at Fischer Technology, Inc. He has a double master's degree in project management and material science and technology and a bachelor's degree in metallurgical engineering. Leveraging his expertise in these fields, he provides technical support to customers and sales engineers, addressing their queries and assisting them in troubleshooting instrument-related challenges.
Melissa Agneta
Materials Application Engineer
Melissa Agneta is a material application engineer at Fischer Technology, Inc., where she supports customers and Fischer sales engineers in providing metrology solutions for a wide variety of applications in business, spanning many industries. Prior to working at Fischer Technology, she worked as a field quality engineer in the fuel cells sector. Melissa earned her bachelor's degree in chemical engineering and green belt certification in Lean Six Sigma at the University of Maine.
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