Bowman Showcases XRF Plating Thickness Measurement Systems
Photo Credit: Bowman Bowman says its X-ray fluorescence (XRF) plating thickness measurement systems are fast, accurate and also perform alloy analysis and solutions analysis.
Bowman says its X-ray fluorescence (XRF) plating thickness measurement systems are fast, accurate and also perform alloy analysis and solutions analysis. All Bowman XRFs determine percent composition for each alloying element and alloy-grade numbers.
Bowman advantages include the ability to precisely measure the percent of phosphorus, polycapillary optics for a clean, scatter-free beam; faster test speeds; laser auto focus and flux 100-times higher than collimators for the counting of more photons.
Bowman Silicon Drift Detectors (SDDs) reportedly produce the highest count rates, with lowest baseline noise and best detection limits. SDDs precisely measure overlapping elements – nickel, copper, zinc, chrome, iron – where there’s minimal signal separation. They are made in the USA.
Bowman XRF | 847-781-3523 | www.bowmanxrf.com | Booth 328
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