Analyzer for Smart Coatings and Connected Measurements

Hitachi High-Tech Analytical Science, a Hitachi High-Tech Corp. wholly owned subsidiary engaged in the manufacture and sales of analysis and measuring instruments, has expanded its coatings and materials analysis range with a new FT210 XRF analyzer.

The analyzer includes a proportional counter detector for routine measurements of common platings and incorporates advanced user-friendly features designed to enhance high-volume testing.

The product launch also includes an updated version of FT Connect software for all FT200 Series models, with enhanced usability features for reporting, creating calibrations and data handling. This new version of FT Connect expands the RoHS screening capabilities of the FT230. FT Connect V1.2 software is compatible with both new and existing instruments. 

The FT210, much like the FT230, includes features to improve productivity by reducing the time needed to set up a measurement and act on data. To accelerate analysis setup, the FT200 Series comes with a large sample view, wide view camera, auto-focus and auto approach, and a smart recognition feature called Find My Part, which automatically recognizes features to be measured and chooses the correct analytical method.

New FT Connect software updates mean that the FT230 can now be used to check more materials for conformity to the latest hazardous substance directives. The RoHS screening capabilities are built into the FT Connect’s interface.

Matt Kreiner, Hitachi High-Tech Analytical Science’s Coatings Analysis Product Manager, says, “The FT210 offers our customers the ability to choose the best detector for their coating applications. Thanks to the introduction of the new software features, we’ve continued to innovate on how operators interact with an XRF coatings analyzer to increase testing volumes by simplifying setup and reducing the potential for mistakes. By using either the FT210 or the FT230, XRF owners can gain up to 45 minutes of operator time back per day to focus on value-added tasks or to increase testing volumes.”