Benchtop Analyzers Measure Large Parts, Small Features
Hitachi High-Technology Analytical Science’s FT110A benchtop energy dispersive X-ray fluorescence (EDXRF) analyzer is designed to measure large parts with complex geometries, while the FT150 model is suited for analyzing ultra-thin coatings on small features.
Hitachi High-Technology Analytical Science’s FT110A benchtop energy dispersive X-ray fluorescence (EDXRF) analyzer is designed to measure large parts with complex geometries, while the FT150 model is suited for analyzing ultra-thin coatings on small features.
The FT110A features a large chamber that can be configured with either a fully enclosed or slotted door, and it accommodates automotive components and decorative hardware as easily as it handles small fasteners, the company says. The auto-focus routine allows for measurements to be taken as far away as 80 mm from the sample surface, well-suited for measuring recessed areas or multiple parts of different heights. The auto-approach function offers one-touch positioning to set the X-ray components at the ideal distance for reproducible results. A wide-view camera presents an image of the whole sample to make it easy to locate the desired measurement location.
The FT150 has a polycapillary optic that focuses the X-ray beam to a diameter of less than 20 microns, allowing for measurement of features smaller than is possible with traditional collimation, the company says. It also has a high-sensitivity, high-resolution Vortex silicon drift detector; high-precision stage; and high-definition camera with digital zoom.Related Content
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