Bowman's L-Series XRF Produces Three Times Conventional Photon Counts
The close proximity of its X-ray tube to its PIN detector produces more than three times the photon counts of conventional XRFs, the company says.
Share
Bowman’s L-Series XRF (X-ray Fluorescence) is a plating thickness measurement system with a fully enclosed chamber that accommodates samples up to 22″ × 24″ × 13″. A variable focus camera enables quick measurement of recessed areas. The close proximity of its X-ray tube to its PIN detector produces more than three times the photon counts of conventional XRFs in a shorter time, the company says. Bowman manufactures seven XRFs, each made for specific part sizes and throughput, all made in the U.S.
Bowman Exhibits|847-781-3523|bowmanxrf.com
Related Content
-
Business Card Doubles as a Wet Film Thickness Gauge
The customizable card can be used to measure wet film thickness.
-
Handheld Device Receives Software Update for Noncontact Coating Thickness Measurement
Swiss-based coating provider AG is releasing a software update for its advanced thermal optics handheld device, the Coatmaster Flex.
-
Mastering Uniformity Through Surface Prep Standardization
By standardizing surface preparation processes and adopting surface energy measurement, a company can achieve uniformity, quality and cost reduction.
