Bowman's L-Series XRF Produces Three Times Conventional Photon Counts
The close proximity of its X-ray tube to its PIN detector produces more than three times the photon counts of conventional XRFs, the company says.
Bowman’s L-Series XRF (X-ray Fluorescence) is a plating thickness measurement system with a fully enclosed chamber that accommodates samples up to 22″ × 24″ × 13″. A variable focus camera enables quick measurement of recessed areas. The close proximity of its X-ray tube to its PIN detector produces more than three times the photon counts of conventional XRFs in a shorter time, the company says. Bowman manufactures seven XRFs, each made for specific part sizes and throughput, all made in the U.S.
Bowman Exhibits|847-781-3523|bowmanxrf.com
Related Content
-
Shedding Light on Surface Inspection
State-of-the-art reflector-based lighting system improves luminosity and ergonomics for surface inspection tasks while reducing energy usage.
-
Titrations: To Automate or Not to Automate?
What considerations should you keep in mind for automatic titrations? Conor McAnespie of Hanna Instruments discusses the benefits of auto titrators.
-
Multi-Functional Coating Test Instruments Operate Like “Swiss Army Knives”
With greater flexibility than limited traditional equipment, modern analytical instruments can ensure reliable coating performance by measuring critical characteristics like friction, peel, wear, and scratch resistance.
