X-Ray Fluorescence Plating Thickness Measurement System
Bowman to exhibit the L Series XRF versatile plating thickness measurement system
Bowman’s L Series XRF (X-ray fluorescence) plating thickness measurement system is a fully enclosed chamber that accommodates samples up to 22″x 24″x 13″. Variable focus camera allows quick measurement of recessed areas. Solid state PIN detector, long-life micro-focus X-ray tube. Unique close proximity of the X-ray tube to the detector produces more than 3X the photon counts of conventional XRFs, in a shorter time. Bowman manufactures seven XRFs, each tailored to specific part sizes and throughput, all USA made. Expert local XRF service, support and calibration for all major XRF brands, also Standards and Standards re-certification.
Bowman Analytics | 847-781-3523 | bowmanxrf.com
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