XRF Device Optimized for Coating Thickness Measurement, Alloy Analysis
Fischer Technology’s lightweight Fischerscope Xan 500 X-ray fluorescence (XRF) instrument can be used as a handheld device or a fully enclosed desktop unit, or integrated directly into production lines.
The Fischerscope Xan 500 XRF instrument can be used as a handheld device or a fully enclosed desktop unit, or integrated directly into production lines.
The Phascope Paint is designed to quickly and easily measure the thickness of paint layers on magnetic substrates such as steel or iron as well as non-magnetic metals such as aluminum, without the need to switch the device or the probe.
At FABTECH 2018, Fischer Technology will demonstrate its lightweight Fischerscope Xan 500 X-ray fluorescence (XRF) instrument, which can be used as a handheld device or a fully enclosed desktop unit, or integrated directly into production lines.
The unit is optimized for coating thickness measurement and alloy analysis, making it well-suited for quality inspection and process control of electroplated, multilayer and alloy coatings. Its small size enables it to measure geometries such as large irregularly shaped parts or in offline locations.
The company’s small, pen-shaped Phascope Paint instrument is designed to quickly and easily measure the thickness of paint layers on magnetic substrates such as steel or iron as well as non-magnetic metals such as aluminum, without the need to switch the device or the probe.
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